Optimizing High-Throughput SEM for Large-area Defect Characterization in AM Steel

Supplementary Information

Table SI.1:Overview of algroithm detection Parameters used for raw images

Pixel Size [nm]Dwell time [µs]Gaussian FidelityGaussian RangeCanny SigmaK sizeCanny MinimumCanny Maximum
48.81303513.1019741
0.75403513.1019741
0.5403513.1019741
0.32019110.0025520
0.12019110.0025520
97.65251512.101377126
1301112.101357106
0.756142533.90513787
0.5351512.101340106
0.34019113.00131550
0.14019115.00152050
195.310301112.101367106
5424211.4011514498
14130534.5065141215
0.75424211.4011514498
0.55125772.406922591
0.3424211.4011514498
0.1401913.20212050
390.6103315311.063133212
5371539.08430252
13719733.7131138125
0.754711934.465173178
0.55118950.00510163
0.32311743.725150165
0.14520911.506114184

Table SI.2:Overview of algroithm detection Parameters used for denoised images

Pixel Size [nm]Dwell time [µs]Gaussian FidelityGaussian RangeCanny SigmaK sizeCanny MinimumCanny Maximum
48.81175032.411516771
0.751056127.4571119219
0.51351550.0051180255
0.3751336.3045110225
0.173619.283999249
97.65162199.4751219211
1122116.78455827
0.751031912.225111119
0.51027724.13519248
0.3103210.10510255
0.193171.565195120
195.310141273.10950102
5131097.233514184
114990.1027127169
0.75131090.103522255
0.5131090.10510255
0.3101070.10318203
0.11112323.077145255
390.610116520.2171227229
591092.7635123132
1107350.0019255199
0.75157945.393251164
0.5330.49390134
0.31615124.4349204196
0.1201432.02258641